X-Ray Photoelectron Spectroscopy (XPS)


Surface characterization of solids by X-ray photoelectron Spectroscopy is carried out in a ESCA+ equipment by Omicron.  The system is equiped with a dual X-ray source (MgKalpha=1253.6 eV, AlKalpha=1486.6eV), an electrostatic hemispherical analyser and detector with 7 channeltrons. It is possible to perform depth profiling (ion gun), imaging (lateral resolution of 60 microns) and sample pretreatment in a reaction chamber.

Technical staff: Elvira Aylón, Isaías Fernández

Analysis application forms